SPECKLE 2012V International Conference on Speckle Metrology : 10-12 september 2012 : Vigo, Spain
- Ángel F. Doval ed. lit.
- Cristina Trillo ed. lit.
- Juan Carlos López Vázquez ed. lit.
Argitaletxea: SPIE, The International Society for Optics and Photonics,
ISBN: 9780819490902
Argitalpen urtea: 2012
Mota: Liburua