An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations

  1. Hurtado-Ramos, J.B.
  2. Blanco-García, J.
  3. Fernández, A.
  4. Ribas, F.
Journal:
Measurement Science and Technology

ISSN: 0957-0233

Year of publication: 2001

Volume: 12

Issue: 5

Pages: 644-651

Type: Article

DOI: 10.1088/0957-0233/12/5/312 GOOGLE SCHOLAR
Data source: Scopus