High resolution x-ray elemental mapping of nanoparticles in the STEM

  1. Watanabe, M.
  2. Burrows, A.
  3. Herzing, A.A.
  4. Kiely, C.J.
  5. Williams, D.B.
  6. Hutchings, G.
  7. Liz-Marzin, L.M.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276

Année de publication: 2004

Volumen: 10

Número: SUPPL. 2

Pages: 468-469

Type: Communication dans un congrès

DOI: 10.1017/S1431927604886665 GOOGLE SCHOLAR
La source de données: Scopus