High-resolution electron microscopy study of SiGeC thin films grown on Si(1 0 0) by laser-assisted techniques
- Lioutas, Ch.B.
- Frangis, N.
- Soumelidis, S.
- Chiussi, S.
- López, E.
- León, B.
ISSN: 0169-4332
Year of publication: 2006
Volume: 252
Issue: 13 SPEC. ISS.
Pages: 4527-4530
Type: Article