Data collection and reliability analysis of aged electronic devices
- Soto-Campos, E.
- Marcos-Acevedo, J.
- Fernández-Gómez, S.
- Álvarez-Santos, R.
ISSN: 0149-144X
ISBN: 9780780397668, 0-7803-9766-5, 0-7803-9767-3
Year of publication: 2007
Pages: 220-225
Type: Conference paper