Signal integrity enhancement in digital circuits

  1. Semião, J.F.L.C.
  2. Irago, M.J.R.
  3. Rodrïuez-Andina, J.J.
  4. Piccoli, L.B.
  5. Vargas, F.L.
  6. dos Santos, M.B.
  7. Teixeira, I.M.C.
  8. Teixeira, J.P.
Journal:
IEEE Design and Test of Computers

ISSN: 0740-7475

Year of publication: 2008

Volume: 25

Issue: 5

Pages: 452-461

Type: Article

DOI: 10.1109/MDT.2008.146 GOOGLE SCHOLAR
Data source: Scopus