Delay-fault tolerance to power supply voltage disturbances analysis in nanometer technologies
- Semião, J.
- Freijedo, J.
- Rodriguez-Andina, J.
- Vargas, F.
- Santos, M.
- Teixeira, I.
- Teixeira, P.
Konferenzberichte:
2009 15th IEEE International On-Line Testing Symposium, IOLTS 2009
ISBN: 9781424445950
Datum der Publikation: 2009
Seiten: 223-228
Art: Konferenz-Beitrag