Face recognition across pose with automatic estimation of pose parameters through AAM-based landmarking

  1. Teijeiro-Mosquera, L.
  2. Alba-Castro, J.L.
  3. González-Jiménez, D.
Proceedings:
Proceedings - International Conference on Pattern Recognition

ISSN: 1051-4651

ISBN: 9780769541099

Year of publication: 2010

Pages: 1339-1342

Type: Conference paper

DOI: 10.1109/ICPR.2010.332 GOOGLE SCHOLAR
Data source: Scopus