The impact of long-term memory effects on diode power probes

  1. Gomes, H.
  2. Testera, A.R.
  3. Carvalho, N.B.
  4. Barciela, M.F.
  5. Remley, K.A.
Proceedings:
IEEE MTT-S International Microwave Symposium Digest

ISSN: 0149-645X

ISBN: 978-1-4244-7732-6,  978-1-4244-6058-8,  978-1-4244-6056-4,  978-1-4244-6057-1

Year of publication: 2010

Pages: 596-599

Type: Conference paper

DOI: 10.1109/MWSYM.2010.5514791 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus