Using X-parameters to model diode-based RF power probes
- Boaventura, A.S.
- Testera, A.R.
- Carvalho, N.B.
- Barciela, M.F.
Aktak:
IEEE MTT-S International Microwave Symposium Digest
ISSN: 0149-645X
ISBN: 9781612847566
Argitalpen urtea: 2011
Mota: Biltzar ekarpena