Modeling the effect of process, power-supply voltage and temperature variations on the timing response of nanometer digital circuits
- Freijedo, J.F.
- Semião, J.
- Rodriguez-Andina, J.J.
- Vargas, F.
- Teixeira, I.C.
- Teixeira, J.P.
ISSN: 1573-0727, 0923-8174
Datum der Publikation: 2012
Ausgabe: 28
Nummer: 4
Seiten: 421-434
Art: Artikel