Design of a new microcontroller-based vernier fringe counter for interferometric measurement of Laser Wavelength

  1. Diz-Bugarín, J.
  2. Outumuro-González, I.
  3. Vázquez-Dorrío, J.B.
  4. Valencia-Álvarez, J.L.
  5. Blanco-García, J.
Revue:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Année de publication: 2016

Volumen: 65

Número: 2

Pages: 407-412

Type: Article

DOI: 10.1109/TIM.2015.2482258 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus