Improving selection-channel-aware steganalysis features

  1. Denemark, T.
  2. Fridrich, J.
  3. Comesaña-Alfaro, P.
Actas:
IS and T International Symposium on Electronic Imaging Science and Technology

ISSN: 2470-1173

Ano de publicación: 2016

Tipo: Achega congreso

DOI: 10.2352/ISSN.2470-1173.2016.8.MWSF-080 GOOGLE SCHOLAR