Characterization of porous aluminium oxide films from a.c. impedance measurements

  1. González, J.A.
  2. López, V.
  3. Bautista, A.
  4. Otero, E.
  5. Nóvoa, X.R.
Revue:
Journal of Applied Electrochemistry

ISSN: 0021-891X

Année de publication: 1999

Volumen: 29

Número: 2

Pages: 229-238

Type: Article

DOI: 10.1023/A:1003481418291 GOOGLE SCHOLAR
La source de données: Scopus