Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-ray Spectroscopy
- De Backer, A.
- Zhang, Z.
- van den Bos, K.H.W.
- Bladt, E.
- Sánchez-Iglesias, A.
- Liz-Marzán, L.M.
- Nellist, P.D.
- Bals, S.
- Van Aert, S.
Aldizkaria:
Small Methods
ISSN: 2366-9608
Argitalpen urtea: 2022
Alea: 6
Zenbakia: 11
Mota: Artikulua