Improving the tolerance of pipeline based circuits to power supply or temperature variations

  1. Semiao, J.
  2. Rodriguez-Andina, J.J.
  3. Vargas, F.
  4. Santos, M.B.
  5. Teixeira, I.C.
  6. Teixeira, J.P.
Proceedings:
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

ISSN: 1550-5774

ISBN: 9780769528854

Year of publication: 2007

Pages: 303-311

Type: Conference paper

DOI: 10.1109/DFT.2007.60 GOOGLE SCHOLAR
Data source: Scopus