Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn Si (111) - (3×3) R30° surface
- Sugimoto, Y.
- Pou, P.
- Custance, Ó.
- Jelinek, P.
- Morita, S.
- Pérez, R.
- Abe, M.
ISSN: 1098-0121, 1550-235X
Year of publication: 2006
Volume: 73
Issue: 20
Type: Article