Tecnoloxía electrónica
Fachbereich
Miguel
Santamaría Sánchez
Publikationen, an denen er mitarbeitet Miguel Santamaría Sánchez (13)
2006
-
Image processing application with a TSK fuzzy model
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
-
Sistema borroso de inspección del rebarnizado de tapas en la industria metalgráfica
Informacion Tecnologica, Vol. 17, Núm. 4, pp. 4
2005
-
A case study in using a fuzzy system in a manufacturing process inspection
Proceedings - 4th Conference of the European Society for Fuzzy Logic and Technology and 11th French Days on Fuzzy Logic and Applications, EUSFLAT-LFA 2005 Joint Conference
-
Can end inspection with image processing and fuzzy modelling
Proceedings - International Conference on Computational Intelligence for Modelling, Control and Automation, CIMCA 2005 and International Conference on Intelligent Agents, Web Technologies and Internet
-
Easy open can end inspection using UV black light
Proceedings of the 2005 International Conference on Computer Vision, VISION'05
-
Fuzzy image processing in quality control application
Proceedings - Sixth International Conference on Computational Intelligence and Multimedia Applications, ICCIMA 2005
-
Image processing application with a TSK fuzzy model
Lecture Notes in Artificial Intelligence (Subseries of Lecture Notes in Computer Science)
2004
-
Can end inspection using neuro-fuzzy modeling
2004 IEEE Conference on Cybernetics and Intelligent Systems
-
Fuzzy inference system to inspect coating in canmaking industry
Proceedings of the IEEE International Conference on Industrial Technology
2003
-
Fuzzy models to perform container inspection and closing machine predictive control
Proceedings of the IASTED International Conference on Intelligent Systems and Control
2002
-
Fish cans inspection based on image processing
6TH WORLD MULTICONFERENCE ON SYSTEMICS, CYBERNETICS AND INFORMATICS, VOL XVII, PROCEEDINGS
2001
-
Implementing can seaming supervisory control using machine vision
IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
-
Modelling vision inspection system for fuzzy logic
IECON Proceedings (Industrial Electronics Conference)