SPECKLE 2012V International Conference on Speckle Metrology : 10-12 september 2012 : Vigo, Spain

  1. Ángel F. Doval ed. lit.
  2. Cristina Trillo ed. lit.
  3. Juan Carlos López Vázquez ed. lit.

Editorial: SPIE, The International Society for Optics and Photonics,

ISBN: 9780819490902

Ano de publicación: 2012

Tipo: Libro

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