Algorithm for surface contouring using two-source phase-stepping digital shearography
- Fernández, A.
- Dávila, A.
- Pérez-López, C.
- Mendiola, G.
- Blanco-García, J.
Aldizkaria:
Proceedings of SPIE-The International Society for Optical Engineering
ISSN: 0277-786X
Argitalpen urtea: 2001
Alea: 4419
Orrialdeak: 170-173
Mota: Artikulua