Algorithm for surface contouring using two-source phase-stepping digital shearography

  1. Fernández, A.
  2. Dávila, A.
  3. Pérez-López, C.
  4. Mendiola, G.
  5. Blanco-García, J.
Revue:
Proceedings of SPIE-The International Society for Optical Engineering

ISSN: 0277-786X

Année de publication: 2001

Volumen: 4419

Pages: 170-173

Type: Article

DOI: 10.1117/12.437103 GOOGLE SCHOLAR