Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-VDD test

  1. Rodriguez-Irago, M.
  2. Andina, J.J.R.
  3. Vargas, F.
  4. Santos, M.B.
  5. Teixeira, I.C.
  6. Teixeira, J.P.
Actes de conférence:
Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005

ISBN: 9780769524061

Année de publication: 2005

Volumen: 2005

Pages: 281-286

Type: Communication dans un congrès

DOI: 10.1109/IOLTS.2005.25 GOOGLE SCHOLAR
La source de données: Scopus