Quality control of wood-pulp chips using a 3D laser scanner and functional pattern recognition

  1. López, M.
  2. Vilán, J.A.
  3. Matías, J.M.
  4. Taboada, J.
Proceedings:
IEEE International Symposium on Industrial Electronics

ISBN: 9781424407552

Year of publication: 2007

Pages: 1773-1778

Type: Conference paper

DOI: 10.1109/ISIE.2007.4374874 GOOGLE SCHOLAR
Data source: Scopus