Model-based steganalysis using invariant features

  1. Quach, T.-T.
  2. Pérez-González, F.
  3. Heileman, G.L.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819475046

Year of publication: 2009

Volume: 7254

Type: Conference paper

DOI: 10.1117/12.810507 GOOGLE SCHOLAR