Investigating the use of BICS to detect resistive- open defects in SRAMs

  1. Chipana, R.
  2. Bolzani, L.
  3. Vargas, F.
  4. Semião, J.
  5. Rodríguez-Andina, J.
  6. Teixeira, I.
  7. Teixeira, P.
Proceedings:
Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010

ISBN: 9781424477227

Year of publication: 2010

Pages: 200-201

Type: Conference paper

DOI: 10.1109/IOLTS.2010.5560207 GOOGLE SCHOLAR
Data source: Scopus