Modeling the effect of process variations on the timing response of nanometer digital circuits
- Freijedo, J.
- Semião, J.
- Rodríguez-Andina, J.J.
- Vargas, F.
- Teixeira, I.C.
- Teixeira, J.P.
Konferenzberichte:
LATW 2011 - 12th IEEE Latin-American Test Workshop
ISBN: 9781457714900
Datum der Publikation: 2011
Art: Konferenz-Beitrag