Modeling the effect of process variations on the timing response of nanometer digital circuits

  1. Freijedo, J.
  2. Semião, J.
  3. Rodríguez-Andina, J.J.
  4. Vargas, F.
  5. Teixeira, I.C.
  6. Teixeira, J.P.
Proceedings:
LATW 2011 - 12th IEEE Latin-American Test Workshop

ISBN: 9781457714900

Year of publication: 2011

Type: Conference paper

DOI: 10.1109/LATW.2011.5985927 GOOGLE SCHOLAR
Data source: Scopus