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Verification artifact for photogrammetric measurement systems
González-Jorge, H.
Riveiro, B.
Armesto, J.
Arias, P.
Journal
:
Optical Engineering
ISSN
:
0091-3286
,
1560-2303
Year of publication
:
2011
Volume
:
50
Issue
:
7
Type
:
Article
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DOI:
10.1117/1.3598868
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Data source: Scopus
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