Modeling the effect of process, power-supply voltage and temperature variations on the timing response of nanometer digital circuits

  1. Freijedo, J.F.
  2. Semião, J.
  3. Rodriguez-Andina, J.J.
  4. Vargas, F.
  5. Teixeira, I.C.
  6. Teixeira, J.P.
Revista:
Journal of Electronic Testing: Theory and Applications (JETTA)

ISSN: 1573-0727 0923-8174

Ano de publicación: 2012

Volume: 28

Número: 4

Páxinas: 421-434

Tipo: Artigo

DOI: 10.1007/S10836-012-5297-0 GOOGLE SCHOLAR