Multi-stacks of epitaxial GeSn self-assembled dots in Si: Structural analysis

  1. Oliveira, F.
  2. Fischer, I.A.
  3. Benedetti, A.
  4. Cerqueira, M.F.
  5. Vasilevskiy, M.I.
  6. Stefanov, S.
  7. Chiussi, S.
  8. Schulze, J.
Journal:
Journal of Applied Physics

ISSN: 1089-7550,  0021-8979

Year of publication: 2015

Volume: 117

Issue: 12

Type: Article

DOI: 10.1063/1.4915939 GOOGLE SCHOLAR
Data source: Scopus