Multi-stacks of epitaxial GeSn self-assembled dots in Si: Structural analysis

  1. Oliveira, F.
  2. Fischer, I.A.
  3. Benedetti, A.
  4. Cerqueira, M.F.
  5. Vasilevskiy, M.I.
  6. Stefanov, S.
  7. Chiussi, S.
  8. Schulze, J.
Aldizkaria:
Journal of Applied Physics

ISSN: 1089-7550 0021-8979

Argitalpen urtea: 2015

Alea: 117

Zenbakia: 12

Mota: Artikulua

DOI: 10.1063/1.4915939 GOOGLE SCHOLAR