Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-ray Spectroscopy

  1. De Backer, A.
  2. Zhang, Z.
  3. van den Bos, K.H.W.
  4. Bladt, E.
  5. Sánchez-Iglesias, A.
  6. Liz-Marzán, L.M.
  7. Nellist, P.D.
  8. Bals, S.
  9. Van Aert, S.
Revista:
Small Methods

ISSN: 2366-9608

Ano de publicación: 2022

Volume: 6

Número: 11

Tipo: Artigo

DOI: 10.1002/SMTD.202200875 GOOGLE SCHOLAR