In-plane deformation measurement using ESPI carrier fringes
- Blanco-Garcia, J
- Fernandez, A
- Ribas, F
- Hurtado, J
- Jacquot, P (coord.)
- Fournier, JM (coord.)
ISBN: 3-540-67943-X
Argitalpen urtea: 2000
Orrialdeak: 275-280
Biltzarra: Conference on Interferometry in Speckle Light: Theory and Applications
Mota: Biltzar ekarpena