In-plane deformation measurement using ESPI carrier fringes

  1. Blanco-Garcia, J
  2. Fernandez, A
  3. Ribas, F
  4. Hurtado, J
Livre:
INTERFEROMETRY IN SPECKLE LIGHT
  1. Jacquot, P (coord.)
  2. Fournier, JM (coord.)

ISBN: 3-540-67943-X

Année de publication: 2000

Pages: 275-280

Congreso: Conference on Interferometry in Speckle Light: Theory and Applications

Type: Communication dans un congrès

GOOGLE SCHOLAR
La source de données: WoS