Structure and stability of semiconductor tip apexes for atomic force microscopy

  1. Pou, P.
  2. Ghasemi, S.A.
  3. Jelinek, P.
  4. Lenosky, T.
  5. Goedecker, S.
  6. Perez, R.
Aldizkaria:
Nanotechnology

ISSN: 0957-4484,  1361-6528

Argitalpen urtea: 2009

Alea: 20

Zenbakia: 26

Mota: Artikulua

DOI: 10.1088/0957-4484/20/26/264015 GOOGLE SCHOLAR
Datuen iturria: Scopus