Structure and stability of semiconductor tip apexes for atomic force microscopy

  1. Pou, P.
  2. Ghasemi, S.A.
  3. Jelinek, P.
  4. Lenosky, T.
  5. Goedecker, S.
  6. Perez, R.
Revue:
Nanotechnology

ISSN: 0957-4484,  1361-6528

Année de publication: 2009

Volumen: 20

Número: 26

Type: Article

DOI: 10.1088/0957-4484/20/26/264015 GOOGLE SCHOLAR
La source de données: Scopus