Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn Si (111) - (3×3) R30° surface

  1. Sugimoto, Y.
  2. Pou, P.
  3. Custance, Ó.
  4. Jelinek, P.
  5. Morita, S.
  6. Pérez, R.
  7. Abe, M.
Revista:
Physical Review B - Condensed Matter and Materials Physics

ISSN: 1098-0121,  1550-235X

Ano de publicación: 2006

Volume: 73

Número: 20

Tipo: Artigo

DOI: 10.1103/PHYSREVB.73.205329 GOOGLE SCHOLAR
Fonte de datos: Scopus