JESUS
BLANCO GARCIA
CATEDRATICO/A DE ESCOLA UNIVERSITARIA - TEMPO COMPLETO
Centro de Investigaciones en Óptica
León, MéxicoPublications en collaboration avec des chercheurs de Centro de Investigaciones en Óptica (5)
2001
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Algorithm for surface contouring using two-source phase-stepping digital shearography
Proceedings of SPIE-The International Society for Optical Engineering, Vol. 4419, pp. 170-173
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An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations
Measurement Science and Technology, Vol. 12, Núm. 5, pp. 644-651
2000
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Measurement of transient out-of-plane displacement gradients in plates using double-pulsed subtraction TV shearography
Optical Engineering, Vol. 39, Núm. 8, pp. 2106-2113
1998
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Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis
Proceedings of SPIE - The International Society for Optical Engineering
1997
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Study of transient deformations with pulsed TV holography: Application to crack detection
Applied Optics, Vol. 36, Núm. 10, pp. 2058-2065