Publicacións en colaboración con investigadores/as de Centro de Investigaciones en Óptica (11)

2022

  1. Erratum: Local curvatures and its measurements of an optical surface or a wavefront: A review (Optical Engineering (2022) 61:5 (050901) DOI: 10.1117/1.OE.61.5.050901)

    Optical Engineering

  2. Local curvatures and its measurements of an optical surface or a wavefront: a review

    Optical Engineering, Vol. 61, Núm. 5

2001

  1. Algorithm for surface contouring using two-source phase-stepping digital shearography

    Proceedings of SPIE-The International Society for Optical Engineering, Vol. 4419, pp. 170-173

  2. An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations

    Measurement Science and Technology, Vol. 12, Núm. 5, pp. 644-651

  3. Erratum: Family of detuning-insensitive phase-shifting algorithms (Journal of the Optical Society of America A: Optics and Image Science, and Vision)

    Journal of the Optical Society of America A: Optics and Image Science, and Vision

2000

  1. Family of detuning-insensitive phase-shifting algorithms

    Journal of the Optical Society of America A: Optics and Image Science, and Vision, Vol. 17, Núm. 10, pp. 1857-1863

  2. Graphic tool to produce tailored symmetrical phase-shifting algorithms

    Optics Letters, Vol. 25, Núm. 1, pp. 64-66

  3. Measurement of transient out-of-plane displacement gradients in plates using double-pulsed subtraction TV shearography

    Optical Engineering, Vol. 39, Núm. 8, pp. 2106-2113

1999

  1. Detuning insensitive algorithms with an odd number of sampling points

    Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3744, pp. 284-289

1998

  1. Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis

    Proceedings of SPIE - The International Society for Optical Engineering

1997

  1. Study of transient deformations with pulsed TV holography: Application to crack detection

    Applied Optics, Vol. 36, Núm. 10, pp. 2058-2065