Escola de Enxeñaría Industrial
Centro
Centro de Investigaciones en Óptica
León, MéxicoPublicacións en colaboración con investigadores/as de Centro de Investigaciones en Óptica (11)
2011
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Optical measurements of self-induced oscillations
Optics and Lasers in Engineering, Vol. 49, Núm. 6, pp. 709-713
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Pulsed TV holography measurement and digital reconstruction of compression acoustic wave fields: Application to nondestructive testing of thick metallic samples
Measurement Science and Technology, Vol. 22, Núm. 2
2009
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3D Fourier method for the measurement of vibration resonant modes acquired with a high-speed camera
Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009
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Multimode vibration analysis with high-speed TV holography and a spatiotemporal 3D Fourier transform method
Optics Express, Vol. 17, Núm. 20, pp. 18014-18025
2008
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Numerical reconstruction of acoustic bulk waves in aluminium from TV holography surface displacement measurements
Proceedings of SPIE - The International Society for Optical Engineering
2007
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Quantifying a similarity of classes of texture images
Applied Optics, Vol. 46, Núm. 23, pp. 5562-5570
2001
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Algorithm for surface contouring using two-source phase-stepping digital shearography
Proceedings of SPIE-The International Society for Optical Engineering, Vol. 4419, pp. 170-173
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An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations
Measurement Science and Technology, Vol. 12, Núm. 5, pp. 644-651
2000
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Measurement of transient out-of-plane displacement gradients in plates using double-pulsed subtraction TV shearography
Optical Engineering, Vol. 39, Núm. 8, pp. 2106-2113
1998
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Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis
Proceedings of SPIE - The International Society for Optical Engineering
1997
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Study of transient deformations with pulsed TV holography: Application to crack detection
Applied Optics, Vol. 36, Núm. 10, pp. 2058-2065