Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system

  1. Curras-Francos, M.C.
  2. Tasker, P.J.
  3. Fernandez-Barciela, M.
  4. O'Keefe, S.S.
  5. Sanchez, E.
  6. Campos-Roca, Y.
  7. Edwards, G.D.
  8. Phillips, W.A.
Konferenzberichte:
Conference Proceedings of the International Symposium on Signals, Systems and Electronics

ISBN: 0-7803-4900-8

Datum der Publikation: 1998

Seiten: 427-431

Art: Artikel

DOI: 10.1109/ISSSE.1998.738110 GOOGLE SCHOLAR
Datenquelle: Scopus