Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system
- Curras-Francos, M.C.
- Tasker, P.J.
- Fernandez-Barciela, M.
- O'Keefe, S.S.
- Sanchez, E.
- Campos-Roca, Y.
- Edwards, G.D.
- Phillips, W.A.
Actes de conférence:
Conference Proceedings of the International Symposium on Signals, Systems and Electronics
ISBN: 0-7803-4900-8
Année de publication: 1998
Pages: 427-431
Type: Article
