Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis

  1. Fernández, A.
  2. Doval, A.F.
  3. Dávila, A.
  4. Blanco-García, J.
  5. Pérez-López, C.
  6. Fernández, J.L.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Year of publication: 1998

Volume: 3478

Pages: 352-358

Type: Conference paper

DOI: 10.1117/12.312955 GOOGLE SCHOLAR
Data source: Scopus