Model-based steganalysis using invariant features
- Quach, T.-T.
- Pérez-González, F.
- Heileman, G.L.
ISSN: 0277-786X
ISBN: 9780819475046
Ano de publicación: 2009
Volume: 7254
Tipo: Achega congreso
Actas:
Proceedings of SPIE - The International Society for Optical Engineering