Modeling the effect of process variations on the timing response of nanometer digital circuits

  1. Freijedo, J.
  2. Semião, J.
  3. Rodríguez-Andina, J.J.
  4. Vargas, F.
  5. Teixeira, I.C.
  6. Teixeira, J.P.
Actas:
LATW 2011 - 12th IEEE Latin-American Test Workshop

ISBN: 9781457714900

Ano de publicación: 2011

Tipo: Achega congreso

DOI: 10.1109/LATW.2011.5985927 GOOGLE SCHOLAR
Fonte de datos: Scopus