Spectroscopy and high-resolution microscopy of single nanocrystals by a focused ion beam registration method

  1. Novo, C.
  2. Funston, A.M.
  3. Pastoriza-Santos, I.
  4. Liz-Marzán, L.M.
  5. Mulvaney, P.
Journal:
Angewandte Chemie - International Edition

ISSN: 1433-7851

Year of publication: 2007

Volume: 46

Issue: 19

Pages: 3517-3520

Type: Article

DOI: 10.1002/ANIE.200700033 GOOGLE SCHOLAR
Data source: Scopus