Spectroscopy and high-resolution microscopy of single nanocrystals by a focused ion beam registration method
- Novo, C.
- Funston, A.M.
- Pastoriza-Santos, I.
- Liz-Marzán, L.M.
- Mulvaney, P.
ISSN: 1433-7851
Year of publication: 2007
Volume: 46
Issue: 19
Pages: 3517-3520
Type: Article