Spectroscopy and high-resolution microscopy of single nanocrystals by a focused ion beam registration method
- Novo, C.
- Funston, A.M.
- Pastoriza-Santos, I.
- Liz-Marzán, L.M.
- Mulvaney, P.
ISSN: 1433-7851
Argitalpen urtea: 2007
Alea: 46
Zenbakia: 19
Orrialdeak: 3517-3520
Mota: Artikulua