División de Deseño e Microelectrónica
TE1
Instituto de Engenharia de Sistemas e Computadores Investigação e Desenvolvimento
Lisboa, PortugalPublicacións en colaboración con investigadores/as de Instituto de Engenharia de Sistemas e Computadores Investigação e Desenvolvimento (15)
2011
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IP core to leverage RTOS-based embedded systems reliability to electromagnetic interference
Proceedings of the 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits 2011, EMC COMPO 2011
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Modeling the effect of process variations on the timing response of nanometer digital circuits
LATW 2011 - 12th IEEE Latin-American Test Workshop
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Performance failure prediction using built-in delay sensors in FPGAs
Proceedings - 21st International Conference on Field Programmable Logic and Applications, FPL 2011
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Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects
LATW 2011 - 12th IEEE Latin-American Test Workshop
2010
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Delay modeling for power noise-aware design in Spartan-3A FPGAS
6th Southern Programmable Logic Conference, SPL 2010 - Proceedings
2009
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Measuring clock-signal modulation efficiency for systems-on-chip in electromagnetic interference environment
2009 10th Latin American Test Workshop, LATW 2009
2008
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Delay modeling for power noise and temperature-aware design and test of digital systems
Journal of Low Power Electronics, Vol. 4, Núm. 3, pp. 385-391
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Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits
Proceedings - 14th IEEE International On-Line Testing Symposium, IOLTS 2008
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Process tolerant design using thermal and power-supply tolerance in pipeline based circuits
2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
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Robust solution for synchronous communication among multi clock domains
IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS
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Signal integrity enhancement in digital circuits
IEEE Design and Test of Computers, Vol. 25, Núm. 5, pp. 452-461
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Time Management for Low-Power Design of Digital Systems
Journal of Low Power Electronics, Vol. 4, Núm. 3, pp. 410-419
2007
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Enhancing the tolerance to power-supply instability in digital circuits
Proceedings - IEEE Computer Society Annual Symposium on VLSI: Emerging VLSI Technologies and Architectures
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Improving the tolerance of pipeline based circuits to power supply or temperature variations
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
2005
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Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-VDD test
Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005