Física aplicada
Departamento
Osaka University
Osaka, JapónPublicacións en colaboración con investigadores/as de Osaka University (14)
2020
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Giant Chirality of the Generation of Hot Electrons in Chiral Metamaterial Perfect Absorbers
Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
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Giant Chirality of the Generation of Hot Electrons in Chiral Metamaterial Perfect Absorbers
2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)
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Giant chirality of the generation of hot electrons in chiral metamaterial perfect absorbers
Optics InfoBase Conference Papers
2019
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Generation of Hot Electrons with Chiral Metamaterial Perfect Absorbers: Giant Optical Chirality for Polarization-Sensitive Photochemistry
ACS Photonics, Vol. 6, Núm. 12, pp. 3241-3252
2015
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Interplay between Switching Driven by the Tunneling Current and Atomic Force of a Bistable Four-Atom Si Quantum Dot
Nano Letters, Vol. 15, Núm. 7, pp. 4356-4363
2013
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Force mapping on a partially H-covered Si(111)-(7×7) surface: Influence of tip and surface reactivity
Physical Review B - Condensed Matter and Materials Physics, Vol. 87, Núm. 15
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Quantum degeneracy in atomic point contacts revealed by chemical force and conductance
Physical Review Letters, Vol. 111, Núm. 10
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Role of tip chemical reactivity on atom manipulation process in dynamic force microscopy
ACS Nano, Vol. 7, Núm. 8, pp. 7370-7376
2008
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Complex patterning by vertical interchange atom manipulation using atomic force microscopy
Science, Vol. 322, Núm. 5900, pp. 413-417
2007
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Assembly of complex nano-structure from single atoms - Chemical identification, manipulation and assembly by AFM-
Shinku/Journal of the Vacuum Society of Japan, Vol. 50, Núm. 3, pp. 181-183
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Chemical identification of individual surface atoms by atomic force microscopy
Nature, Vol. 446, Núm. 7131, pp. 64-67
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Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy
Physical Review Letters, Vol. 98, Núm. 10
2006
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Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn Si (111) - (3×3) R30° surface
Physical Review B - Condensed Matter and Materials Physics, Vol. 73, Núm. 20
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Single atomic contact adhesion and dissipation in dynamic force microscopy
Physical Review Letters, Vol. 96, Núm. 10