CINTECX
Centro de investigación
Japan Science and Technology Agency
Tokio, JapónPublicacións en colaboración con investigadores/as de Japan Science and Technology Agency (4)
2008
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Complex patterning by vertical interchange atom manipulation using atomic force microscopy
Science, Vol. 322, Núm. 5900, pp. 413-417
2007
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Chemical identification of individual surface atoms by atomic force microscopy
Nature, Vol. 446, Núm. 7131, pp. 64-67
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Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy
Physical Review Letters, Vol. 98, Núm. 10
2006
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Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn Si (111) - (3×3) R30° surface
Physical Review B - Condensed Matter and Materials Physics, Vol. 73, Núm. 20